CHUNG Steve | Department of Electronic Engineering, National Chiao Tung University
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概要
- CHUNG Steve S.の詳細を見る
- 同名の論文著者
- Department of Electronic Engineering, National Chiao Tung Universityの論文著者
関連著者
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CHUNG Steve
Department of Electronic Engineering, National Chiao Tung University
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Chung Steve
Department Of Electrical Engineering National Tsing-hua University
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Cheng S.
Department of Physics, University of Nottingham
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YANG Jiuun-Jer
Department of Electronic Engineering, National Chiao Tung University
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Chung Steve
Department Of Electronic Engineering National Chiao Tung University
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Chung Steve
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University
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Yang Jiuun-jer
Department Of Electronic Engineering And Institute Of Semiconductor Technology Chang Gung University
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CHEN Shang-Jr
Department of Electronic Engineering and Institute of Electronics, National Chiao Tung University
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Chen Shang-jr
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University
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Liang M.
Taiwan Semiconductor Manufacturing Co.
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Cheng S.
Department Of Electronic Engineering National Chiao Tung University
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LIN Horng-Chih
National Nano Device Labs.
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Lin Horng-chih
National Nano Device Lab.
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YANG Wen-Jei
Department of Mechanical Engineering, The University of Michigan
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GUO Jyh-Chyurn
Institute of Electronics, National Chiao-Tung University
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HSU Charles
Department of Electrical Engineering, National Tsing-Hua University
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Guo J‐c
Industrial Technol. Res. Inst. Hsing Chu Twn
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Tang Wen-jei
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University
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Cheung Steve
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University
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Huang Dehuan
Erato Yamamoto Quantum Fluctuation Project Jst Ntt Musashino R&d Center
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Chung S
National Chiao Tung Univ. Hsinchu Twn
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Huang D
Ntt Musashino R&d Center Tokyo Jpn
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Wang C.
Departments Of Cytokine Biology Forsyth Dental Center
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Wang C.
Department Of Mathematics And Medhanical Engineering Michigan State University
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Wang C.l.
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University
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Hsu Charles
Department Of Electrical Engineering National Tsing-hua University
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Hsu Charles
Deparment Of Electrical Engineering National Ching Hua University
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CHANG Chien-Hwa
Department of Electronic Engineering, National Chiao Tung University
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LEE Giahn-Horng
Department of Electronic Engineering, National Chiao Tung University
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Yang J‐j
Worldwide Semiconductor Manufacturing Co. Hsinchu Twn
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Yang Jiuun-jer
Worldwide Semiconductor Manufacturing Co.
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Chang Chien-hwa
Department Of Electronic Engineering National Chiao Tung University
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Lee G‐h
Department Of Electronic Engineering National Chiao Tung University
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WU C.C.
Mosel-Vitelic, Hsinchu Science-Based Park
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TAN W.
Mosel-Vitelic, Hsinchu Science-Based Park
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WU H.J.
Mosel-Vitelic, Hsinchu Science-Based Park
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PI S.
Mosel-Vitelic, Hsinchu Science-Based Park
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HUANG Daniel
Mosel-Vitelic, Hsinchu Science-Based Park
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YIH C.
Department of Electronics Engineering, National Chiao Tung University
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WU C.
Mosel-Vitelic
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WU H.
Mosel-Vitelic
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Pi S.
Mosel-vitelic Hsinchu Science-based Park
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Wu H.j.
Mosel-vitelic Hsinchu Science-based Park
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Wu C.c.
Department Of Physics University Of California
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Yih C.m.
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University
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Yih C.-m.
Department Of Electronic Engineering National Chiao Tung University
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Yang Wen-jei
Department Of Mechanical Engineering And Applied Mechanics University Of Michigan
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LIANG M.
Taiwan Semiconductor Manufacturing Company, Hsinchu Science Park
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Lee Giahn-horng
Department Of Electronic Engineering National Chiao Tung University
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YANG W.-J.
Department of Electronic Engineering, National Chiao Tung University
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YANG J.-J.
Worldwide Semiconductor Manufacturing Co.
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Yih Cherng-Ming
Department of Electronic Engineering and Institute of Electronics, National Chiao Tung University, H
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Yih Cheng-ming
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University
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Guo Jyh-chyurn
Institute Of Electronics And Epartment Of Electronics Engineering National Chiao-tung University:sub
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Yang W.-j.
Department Of Electronic Engineering National Chiao Tung University
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Lee G.
Department Of Electronic Engineering National Chiao Tung University
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Lee G.
Department Of Electrical Engineering Iowa State University Ames
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Tan W.
Mosel-vitelic Hsinchu Science-based Park
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Lin Horng-chih
National Chiao Tung University
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Wang C.
Department Of Chemistry Tamkang University
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Chen Shang-jei
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University
著作論文
- A Unified 3-D Mobility Model for the Simulation of Submicron MOS Devices
- New Insight into the Degradation Mechanism of Nitride Spacer with Different Post-Oxide in Submicron LDD MOSFET's
- Charge Pumping Profiling Technique for the Evaluation of Plasma-Charging-Enhanced Hot-Carrier Effect in Short-N-Channel Metal-Oxide-Semiconductor Field-Effect Transistors
- Direct Observation of Channel-Doping-Dependent Reverse Short Channel Effect Using Decoupled C-V Technuque
- A New Observation of the Width Dependent Hot Carrier Effect in Shallow-Trench-Isolated P-MOSFET's
- New Degradation Mechanisms of Width-Dependent Hot Carrier Effect in Quarter-Micron Shallow-Trench-Isolated p-Channel Metal-Oxide-Semiconductor Field-Effect-Transistors
- Quantitative Investigation of Hot Carrier Induced Drain Current Degradation in Submicron Drain-Engineered Metal-Oxide-Semiconductor Field-Effect-Transistors : Semiconductors
- A Novel Conductance Measurement Technique for Profiling the Lateral LDD n-Doping Concentrations of Submicron MOS Devices
- A New Observation of the Reverse Short Channel Effect in Submicron n-MOSFET by Using Gate-Induced Drain Leakage Current Measurement