YANG Jiuun-Jer | Department of Electronic Engineering, National Chiao Tung University
スポンサーリンク
概要
関連著者
-
YANG Jiuun-Jer
Department of Electronic Engineering, National Chiao Tung University
-
CHUNG Steve
Department of Electronic Engineering, National Chiao Tung University
-
Chung Steve
Department Of Electrical Engineering National Tsing-hua University
-
Yang Jiuun-jer
Department Of Electronic Engineering And Institute Of Semiconductor Technology Chang Gung University
-
Chung S
National Chiao Tung Univ. Hsinchu Twn
-
CHANG Chien-Hwa
Department of Electronic Engineering, National Chiao Tung University
-
LEE Giahn-Horng
Department of Electronic Engineering, National Chiao Tung University
-
Yang J‐j
Worldwide Semiconductor Manufacturing Co. Hsinchu Twn
-
Chang Chien-hwa
Department Of Electronic Engineering National Chiao Tung University
-
Lee G‐h
Department Of Electronic Engineering National Chiao Tung University
-
Lee Giahn-horng
Department Of Electronic Engineering National Chiao Tung University
著作論文
- A Unified 3-D Mobility Model for the Simulation of Submicron MOS Devices
- Quantitative Investigation of Hot Carrier Induced Drain Current Degradation in Submicron Drain-Engineered Metal-Oxide-Semiconductor Field-Effect-Transistors : Semiconductors