An Improved Low Voltage Programming Scheme Using Forward Bias Assisted Drain Avalanche Induced Hot Electron Injection on P-Channel EEPROMs
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概要
- 論文の詳細を見る
- 2007-09-19
著者
-
Chung Steve
Department Of Electrical Engineering National Tsing-hua University
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Huang Y.
Department Of Electronic Engineering National Chiao Tung University
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Huang Y.
Department And Institute Of Biology And Anatomy National Defense Medical Center
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