A Novel Microscope for Visualizing Electric Fields in Organic Thin Film Devices Using Electric-Field-Induced Second-Harmonic Generation
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概要
- 論文の詳細を見る
We have developed a novel microscope for visualizing electric fields in organic thin film devices on the basis of electric-field-induced second-harmonic generation (EFISHG) measurement. By using a radial polarized laser beam as a probing light, we showed that the electric field formed in metal--C<inf>60</inf>--metal diodes in the film-thickness direction is visualized. The developed microscope has a potentiality in directly visualizing carrier motion in thin-film devices such as organic solar cells.
- 2013-04-25
著者
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Manaka Takaaki
Department Of Physical Electronics Graduate School Of Science And Engineering Tokyo Institute Of Tec
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Iwamoto Mitsumasa
Department Of Electrical And Electronic Engineering
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Taguchi Dai
Department Of Physical Electronics Tokyo Institute Of Technology
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Karasuda Tetushu
Precise Gauges Co. Ltd., Hamamatsu 433-8105, Japan
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Kyomasu Mikio
Precise Gauges Co. Ltd., Hamamatsu 433-8105, Japan
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