Determination of Dielectric Relaxation Time of Langmuir-Films by a Whole-Curve Method Using the Maxwell Displacement Current

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1998-10-15

著者

• Sato Yoko

  Department of Cardiology, Graduate School of Comprehensive Human Sciences, University of Tsukuba

• IWAMOTO Mitsumasa

  Department of Physical Electronics, Tokyo Institute of Technology

• Sato Yasuhiko

  Process And Manufacturing Engineering Center Semiconductor Company Toshiba Corporation

• Sato Y

  Nagaoka Univ. Technol. Nagaoka Jpn

• MAJIMA Yutaka

  Department of Physical Electronics, Graduate School of science and Engineering, Tokyo Institute of T

• WU Chen-Xu

  Department of Physical Electronics, Tokyo Institute of Technology

• Wu C‐x

  Tokyo Inst. Technol. Tokyo Jpn

• Wu Chen-xu

  Department Of Physical Electronics Tokyo Institute Of Technology

• Sato Yuzuru

  Seiko Epson Corp. Research And Development Div.

• Sato Y

  Department Of Metallurgy Graduate School Of Engineering Tohoku University

• Sato Y

  Ntt Microsystem Integration Laboratories

• 真島 豊

  東京工大

• Majima Yutaka

  Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology

• Sato Yoko

  Department Of Bioscience And Biotechnology Faculty Of Agriculture Tottori University

• Iwamoto Mitsumasa

  Department Of Electrical And Electronic Engineering

• Sato Yoko

  Department of Biomolecular Engineering, Graduate School of Engineering, Tohoku University

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