Nonlinear Characteristics of Insulating LB Films with Nanometer Thickness Sandwiched between Au-Au Contact

概要

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It is well known that the existence of electrically resistive film layers formed on contact surfaces increases contact resistance and it causes a nonlinear relationship between voltage and current observed in a contact layer. Nonlinear distortion voltages can be detected by our sensitive detection system based on the dual frequency method when a thin film exists on the surface. In this study, multilayer films of polyimide (PI) was used as an ideal material of ultra thin film, because of electrically good insulator with simple molecular structure, to study non-linearity through metal-insulator-metal contact. The number of deposited layers between one and twenty one were formed on three types of substrates; (a) evaporated gold on a glass plate, (b) gold plate and (c) evaporated gold on gold plate, to obtain good insulating film. Where each layer of PI film has 0.4 nanometer thickness. A pin contact was made by pressing a bent gold wire on the PI film. It is concluded that [1]; the second-order distortion voltage increases exponentially as the film thickness increases, [2]; polarity of the surface potential of PI depends on the film thickness, and that I-V characteristic depends on the polarity of the surface potential
社団法人電子情報通信学会の論文
1998-03-25