Raman Spectra and Magnetic Property Analysis of Nd-Doped ZnO Thin Films
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概要
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The present investigation is a detailed study aiming to understand the origin of the ferromagnetism of the well-characterized Nd-doped ZnO films. Raman scattering shows that the E2 phonon line of Zn1-xNdxO (x = 0, 0.05, 0.10, and 0.15) is broadened asymmetrically and shifts to a lower frequency, suggesting microscopic structural disorder induced by Nd3+ substitutions. Zn1-xNdxO films exhibit room-temperature ferromagnetism with a Curie temperature higher than 350 K. In addition, the films revealed magnetic anisotropy with higher magnetization in 3 kOe when the field was applied in the perpendicular direction to the sample surface than when applied in an in-plane direction.
- 2013-01-25
著者
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Subramanian Munisamy
Department of Frontier Materials, Graduate School of Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan
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Tanemura Masaki
Department of Environmental Technology & Urban Planning, Nagoya Institute of Technology, Gokisho-cho, Showa-ku, Nagoya 466-8555, Japan
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HIHARA Takehiko
Department of Frontier Materials Graduate School of Engineering, Nagoya Institute of Technology
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Soga Tetsuo
Department of Electrical and Computer Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466
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Senthilkumar Kasilingam
Department of Frontier Materials, Graduate School of Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Japan
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