Fiske Steps of Josephson Tunnel Junctions Formed with Normal-Distribution Functi
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概要
- 論文の詳細を見る
Magnetic field dependence of Fiske steps has been investigated using Nb/Al-AIO_x-/Nb tunnel junctions formed with a normal-distribution function with a dispersion parameter of σ = 0.45. Fiske steps are due to the different resonance mode appearing in the current-voltage characteristics when an external magnetic field is applied to the junctions at 4.2K. Both positions in the voltage scale and current amplitude of Fiske steps were systematically measured. We found that the amplitudes of the Fiske steps increased gradually, and then decreased monotonically with an increase in magnetic field. All Fiske steps almost completely disappeared at a magnetic field of less than 1 mT, at which the dc Josephson critical current also decreased to less than 10^<-3> of the maximum. The position of Fiske steps in the voltage scale was analyzed using a diamond-shaped junction which corresponds to a 45-degree-rotated square junction.
- 社団法人応用物理学会の論文
- 2002-08-15
著者
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明連 広昭
東北大通研
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明連 広昭
埼玉大
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KIKUCHI Katsuhide
Nippon Soken, Inc.
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飯塚 剛
愛媛大学理学部
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Takada S
Saitama University Faculty Of Engineering
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Takada S
Saitama Univ. Urawa‐shi Jpn
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Takada Susumu
Department Of Electric And Electronic System Engineering Saitama University
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Myoren Hiroaki
Department Of Electrical And Electronic Systems Faculty Of Engineering Saitama University
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Iizuka Tomoya
Graduate School Of Science Osaka University
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Inoue T
Kyokugen Osaka University:crest Japan Science Technology Corporation (jst)
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Kikuchi Katsuya
Department Of Physics Faculty Of Science Hokkaido University
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Iizuka Takeshi
Department Of Health And Nutrition Takasaki University Of Health And Welfare
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Takada Susumu
Department Of Chemistry Faculty Of Science Shizuoka University
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Iizuka Takeshi
Department Of Chemistry Faculty Of Education Gunma University
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Kikuchi Katsuya
Department of Electrical and Electronic Systems, Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Urawa, Saitama 338-8570, Japan
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Kikuchi Katsuya
Department of Electrical and Electronic Systems, Faculty of Engineering, Saitama University
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