Influence of Organic Contamination on Silicon Dioxide Integrity

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Mechanical Stress Caused by Adsorption of O or N on Ga-terminated (100) GaAs Surface and InAl-terminated (100) InAlAs Surface : Degradation of Insulator/Semiconductor Interface
Studies of Effects of Adsorption of Silicon or Germanium on the Electronic States of (100) GaAs Surfaces
Oxygen and Sulfur Adsorption Effects on Electronic States of GaAs(100) Surfaces Studied with Discrete Variational Xα Method
Structural and Electrical Characterization of Oxidated, Nitridated and Oxi-nitridated (100) GaAs Surfaces
Properties of "Stoichiometric" Silicon Oxynitride Films
Structural Properties of Ultrathin Amorphous Silicon Oxynitride Layers
Effects of Plasma-Pretreatment on Substrates before Deposition of Polycrystalline Silicon Films(Surfaces, Interfaces, and Films)
Structural and Optical Properties of Nanocrystalline Silicon Films Deposited by Plasma-Enhanced Chemical Vapor Deposition(Optical Properties of Condensed Matter)
Influence of Organic Contamination on Silicon Dioxide Integrity
Effects of Addition of SiF_4 During Growth of Nanocrystalline Silicon Films Deposited at 100℃ by Plasma-Enhanced Chemical Vapor Deposition
Temperature Effects on the Structure of Polycrystalline Silicon Films by Glow-Discharge Decomposition Using SiH_4/SiF_4
Effects of Nitrogen Addition to Fluorinated Silicon Dioxide Films
Initial Growth of Polycrystalline Silicon Films on Substrates Subjected to Different Plasma Treatments
Effects of the Addition of SiF_4 to the SiH_4 Feed Gas for Depositing Polycrystalline Silicon Films at Low Temperature
Stress in Amorphous SiO_x:H Films Prepared by Plasma-Enhanced Chemical Vapor Deposition
Properties of "Stoichiometric" Silicon Oxynitride Films
Effects of Deposition Temperature on Strain in Polycrystalline SiC Films Deposited by Radio-Frequency Glow Discharge
Pressure Effects on CdS Microcrystals Embedded in Germanate Glasses
Raman Scattering of Amorphous Semiconductors Ge-S System under High Hydrostatic Pressure
Optical Pickup Employing a Hologram-Laser-Photodiode Unit
INVESTIGATION OF CLINICAL CHARACTERISTICS OF VENTRICULAR EXTRASYSTOLE IN CHILDREN : Using Two Dimensional RR Interval Plotting Method
Evaluation of Optical Absorption Coefficients of a-SiN:H Films by Photothermal Deflection Spectroscopy(PDS) : Photoacoustic Spectroscopy
AC Discharge Characteristics of a Needle-to-Semicircular-Electrode Gap with Solid Dielectric Surface under High Humidity : Nuclear Science, Plasmas and Electric Discharges
Flashover Characteristics of Impulse Voltages on Solid Dielectric Surfaces under High Humidity
Integrated Optical Unit for Magneto-Optical Pickups
Spherical Aberration Error Detection for Blu-ray Disc Optical Pickups
Time-Dependent Airborne Organic Contaimination on Silicon Wafer Surface Stored in a Plastic Box
Axially Controlled Solid-Phase Crystallization of Amorphous Silicon
Structural and Electrical Properties of P- and B-Doped Polycrystalline Silicon by Plasma-Enhanced CVD at 700℃
Boron Doping to Microeryslalline SiN_H Films
Incorporation Effects of Nitrogen into Phosphorus Doped Microcrystalline Si:H Films
A Case of Advanced Breast Cancer Successfully Treated with Primary Endocrine Therapy
Electron Spin Resonance of Conduction Electrons in Phosphorus Ion-Implanted Silicon
ESR Studies on P^+ Ion-Implanted Si
Plasma-Hydrogenation Effects in Doped CVD Amorphous Silicon Films
Current Transport in Doped Polycrystalline Silicon
Photoluminescence of Hydrogenated Amorphous Carbon Films
Simultaneous Temperature Measurement of Wafers in Chemical Mechanical Polishing of Silicon Dioxide Layer
A pH-Controlled Chemical Mechanical Polishing Method for Thin Bonded Silicon-on-Insulator Wafers
Bond Strength of Bonded SOI Wafers
Pulse-Field-Assisted Wafer Bonding for Silicon on Insulator
ESR Studies on Pyrolyzed and Irradiated Polyacrylonitrile
The Lattice Location of Phosphorus Atoms Implanted into Silicon
Electron Spin Resonance Studies on Ion-Implanted Silicon. : I. Amorphisation
Isothermal Annealing in P+ Ion-Implanted Silicon
Electron Spin Resonance Studies on Ion-Implanted Silicon. : II. Conduction Electrons
Structural Properties of Ultrathin Amorphous Silicon Oxynitride Layers
Time-Dependent Airborne Organic Contamination on Silicon Wafer Surface Stored in a Plastic Box
Properties of "Stoichiometric" Silicon Oxynitride Films

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