X-Ray Diffraction Study on Yba_2Cu_3O_<7-δ> Epitaxial Thin Film Grown by an Activated Reactive Evaporation Method : Electrical Properties of Condensed Matter
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1988-10-20
著者
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Terauchi Hikaru
Department of Physics, Kwansei Gakuin University
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Kamigaki Kousei
Department of Physics, Faculty of Science, Kwansei-Gakuin University
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BANDO Yoshichika
The Institute for Chemical Research,Kyoto University
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Bando Y
The Institute For Chemical Research Kyoto University
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Terauchi H
Kwansei Gakuin Univ. Sanda Jpn
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Terauchi Hikaru
Advanced Research Center Of Science School Of Science And Technology Kwansei Gakuin University
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Terauchi Hikaru
Department Of Physics Kwansei-gakuin University
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Terauchi Hikaru
Department Of Physics School Of Science Kwansei-gakuin University
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Yamamoto K
Univ. Of Tsukuba
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Iijima Kenji
Research Institute For Production Development
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Iijima Kenji
Environmental Technology Research Laboratory Matsushita Electric Industrial Co. Ltd.
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Hirata Kazuto
Research Institute for Production Development
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Yamamoto Kazunuki
Research Institute for Production Development
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TERASHIMA Takahito
Intitute for Chemical Research, Kyoto University
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BANDO Yoshichika
Intitute for Chemical Research, Kyoto University
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Kamigaki K
Department Of Physics Faculty Of Science Kwansei-gakuin University
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Kamigaki Kousei
Department Of Phisics Kwansei-gakuin University
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Yamamoto K
Photonics Research Institute National Institute Of Advanced Industrial Science And Technology (aist)
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Terauchi Hikaru
Department Of Phisics Kwansei-gakuin University
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Yamamoto K
Saga Univ. Saga Jpn
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