Metal/Semiconductor Interfaces Studies by Transmitted X-ray Reflectivity

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2004-04-15

著者

• Sakata Osami

  Experimental Facilities Division Japan Synchrotron Radiation Research Institute

• Inoue Kouji

  Advanced Research Center Of Science Faculty Of Science And Technology Kwansei Gakuin University (arc

• TERAUCHI Hikaru

  Advanced Research Center of Science, School of Science and Technology, Kwansei Gakuin University

• Terauchi Hikaru

  Advanced Research Center Of Science School Of Science And Technology Kwansei Gakuin University

• Terauchi Hikaru

  Advanced Research Center Of Science Faculty Of Science And Technology Kwansei Gakuin University (arc

• Takahashi Isao

  Graduate School Of Engineering Tohoku University

• TAKAHASHI Isao

  Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University

• KITAHARA Amane

  Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University

• Sakata Osami

  Experimental Facilities Division Materials Science Japan Synchrotron Radiation Research Institute (j

• INOUE Koji

  Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University (A

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