KITAHARA Amane | Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University
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概要
- 同名の論文著者
- Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin Universityの論文著者
関連著者
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Inoue Kouji
Advanced Research Center Of Science Faculty Of Science And Technology Kwansei Gakuin University (arc
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TERAUCHI Hikaru
Advanced Research Center of Science, School of Science and Technology, Kwansei Gakuin University
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Terauchi Hikaru
Advanced Research Center Of Science Faculty Of Science And Technology Kwansei Gakuin University (arc
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TAKAHASHI Isao
Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University
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KITAHARA Amane
Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University
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Sakata Osami
Experimental Facilities Division Japan Synchrotron Radiation Research Institute
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Komiya Satoshi
Spring-8/jasri
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AWAJI Naoki
Fujitsu Laboratories Ltd.
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Terauchi Hikaru
Advanced Research Center Of Science School Of Science And Technology Kwansei Gakuin University
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Takahashi Isao
Graduate School Of Engineering Tohoku University
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Doi Syuichi
Fujitsu Laboratories Ltd.
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Nomura Kenji
Fujitsu Laboratories Ltd.
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KADA Tositeru
Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University
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SHIMAZU Hiromitsu
Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University
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TANAKA Norihisa
Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University
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KOMIYA Satoshi
Materials Science Division, Japan Synchrotron Radiation Research Institute (JASRI, Spring-8)
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Sakata Osami
Experimental Facilities Division Materials Science Japan Synchrotron Radiation Research Institute (j
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INOUE Koji
Advanced Research Center of Science, Faculty of Science and Technology, Kwansei Gakuin University (A
著作論文
- Novel Interface Structures between Ultrathin Oxynitride and Si(001) Studied by X-Ray Diffraction
- Metal/Semiconductor Interfaces Studies by Transmitted X-ray Reflectivity