X-Ray Structural Study of Ge(001):Te 1×1 Performed at the Advanced Photon Source. II. Current Status of the Surface-Interface Structure Beamline at SPring-8

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概要

• 論文の詳細を見る
• 日本放射光学会の論文
• 2002-09-30

著者

• Sakata Osami

  Experimental Facilities Division Japan Synchrotron Radiation Research Institute

• Sakata Osami

  Japan Synchrotron Research Institute

• Sakata Osami

  Japan Synchrotron Radiation Research Institute (jasri)

• Sakata Osami

  Japna Synchrotron Radiation Research Institute

• Sakata Osami

  Spring-8

関連論文

• Development of High-Angular-Resolution Microdiffraction System for Reciprocal Space Map Measurements
• Three-Dimensional Reconstruction of Atoms in Surface X-Ray Diffraction
• Formation of Ultra-High-Density Ferromagnetic Column Arrays Beyond 1 Tera/inch^2 Using Porous Alumina Template(Nano-Fabrication and Patterned Media)
• Molecular Aggregation State of Surface-grafted Poly{2-(perfluorooctyl)ethyl acrylate} Thin Film Analyzed by Grazing Incidence X-ray Diffraction
• Analysis of Molecular Aggregation States in Pentacene Thin Films Prepared from Soluble Precursor
• Molecular Aggregation Structure of Poly(fluoroalkyl acrylate) Thin Films Evaluated by Synchrotron-sourced Grazing-incidence X-ray Diffraction
• Metal/Semiconductor Interfaces Studies by Transmitted X-ray Reflectivity
• Evaluation of Internal Stresses in Single-, Double- and Multi-Layered TiN and TiAIN Thin Films by Synchrotron Radiation(Advanced Technology of Experimental Mechanics)
• OS4(P)-16(OS04W0240) Measurement of Residual Stress in Nano-Size Copper Thin Films by Synchrotron Radiation
• OS4(P)-13(OS04W0205) Evaluation of Residual Stress in TiN Thin Films Deposited by Arc-Ion-Plating with Synchrotron Radiation
• OS4(5)-22(OS04W0203) Evaluation of Internal Stresses in Single-, Double- and Multi-Layered TiN and TiAlN Thin Films by Synchrotron Radiation
• Structural characterization of Ar[+]-irradiated SrTiO3 showing room-temperature blue luminescence
• 27aXE-7 Ge(001) : Te 1×1 surface structure probed using X-ray scattering
• X-Ray Structural Study of Ge(001):Te 1×1 Performed at the Advanced Photon Source. II. Current Status of the Surface-Interface Structure Beamline at SPring-8
• Metal/Semiconductor Interfaces Studied by Transmitted X-ray Reflectivity

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