Direct Spectroscopic Evidence of Bias-Induced Shifts of Semiconductor Band Edges for Metal-Insulator-Semiconductor Diodes
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-05-15
著者
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Nishioka Yasushiro
Texas Instruments Tsukuba R & D Center
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Nishioka Yasushiro
Tsukuba Research And Development Center Japan Texas Instruments
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Kobayashi Hidehiko
Faculty Of Engineering Yamanashi University
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Namba K
Texas Instruments Ibaraki Jpn
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Namba Kenji
Texas Instruments Tsukuba R & D Center
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Yamaguchi Yoh-ichi
Hoya Corporation
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Yamashita Yoshiyuki
Department Of Chemistry Faculty Of Engineering Science And Research Center For Photoenergetics Of Or
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Yamashita Yoshiyuki
Institute Of Information Sciences And Electronics University Of Tsukuba
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Kobayashi H
Nagaoka Univ. Technol. Niigata Jpn
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Nishioka Y
Tsukuba Research And Development Center Japan Texas Instruments
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NAKATO Yoshihiro
Research Center for Photoenergetics of Organic Materials and Faculty if Engineering Science, Osaka U
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KOBAYASHI Hikaru
Research Center for Photoenergetics of Organic Materials, and Department of Chemistry, Faculty of En
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YAMASHITA Yoshiyuki
Research Center for Photoenergetics of Organic Materials, and Department of Chemistry, Faculty of En
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NAMBA Kenji
Research Center for Photoenergetics of Organic Materials, and Department of Chemistry, Faculty of En
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Nakato Y
Division Of Chemistry Graduate School Of Engineering Science Osaka University
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Nakato Yoshihiro
Research Center For Photoenergetics Of Organic Materials And Department Of Chemistry Faculty Of Engi
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Kobayashi Hikaru
Research Center For Photoenergetics Of Organic Materials And Department Of Chemistry Faculty Of Engi
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Namba Kenji
Research Center For Photoenergetics Of Organic Materials And Department Of Chemistry Faculty Of Engi
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