Namba Kenji | Texas Instruments Tsukuba R & D Center
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概要
関連著者
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Nishioka Yasushiro
Texas Instruments Tsukuba R & D Center
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Nishioka Yasushiro
Tsukuba Research And Development Center Japan Texas Instruments
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Namba K
Texas Instruments Ibaraki Jpn
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Namba Kenji
Texas Instruments Tsukuba R & D Center
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Nishioka Y
Tsukuba Research And Development Center Japan Texas Instruments
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Kobayashi Hidehiko
Faculty Of Engineering Yamanashi University
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Kobayashi H
Nagaoka Univ. Technol. Niigata Jpn
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KOMEDA Tadahiro
Texas Instruments Tsukuba Research and Development Center Limited
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Komeda Tadahiro
Riken (the Institute Of Physical And Chemical Research)
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Komeda Tadahiro
Texas Instruments Tsukuba R & D Center
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Komeda Tadahiro
Tsukuba Research And Development Center Texas Instruments
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Yamaguchi Yoh-ichi
Hoya Corporation
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Nishioka Yasushiro
Texas Instruments Japan Limited Tsukuba Research And Development Center
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Yamashita Yoshiyuki
Department Of Chemistry Faculty Of Engineering Science And Research Center For Photoenergetics Of Or
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Yamashita Yoshiyuki
Institute Of Information Sciences And Electronics University Of Tsukuba
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Nakato Y
Division Of Chemistry Graduate School Of Engineering Science Osaka University
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松村 正清
東京工業大学工学部:(現)(株)液晶先端技術開発センター
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Sakoda Tatsuya
Interdisciplinary Graduate School Of Engineering Sciences Kyushu University
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Kobayashi Hikaru
Department Of Surgical Oncology Osaka City University Graduate School Of Medicine
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Hoshino Tyuji
Faculty Of Pharmaceutical Sciences Chiba University
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KOBAYASHI Hikaru
Institute of Scientific and Industrial Research, Osaka University
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MIKI Kazushi
Research Center for Advanced Carbon Materials and Nanotechnology Research Institute National Institu
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MIKI Kazushi
Nanotechnology Research Institute-AIST
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YAMASHITA Yoshiyuki
Department of Chemical Engineering, Tohoku University
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MATSUMURA Mieko
Texas Instruments Tsukuba R & D Center
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SAKODA Tomoyuki
Texas Instruments Tsukuba R & D Center
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KUMAGAI Yoshinao
Texas Instruments Tsukuba Research and Development Center Limited
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ANDO Atsushi
Electrotechnical Laboratory (ETL)
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MIKI Kazushi
Electrotechnical Laboratory (ETL)
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NAKATO Yoshihiro
Department of Chemistry, Faculty of Engineering Science, and Research Center for Photoenergetics of
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NAMBA Kenji
Department of Chemistry, Faculty of Engineering Science, and Research Center for Photoenergetics of
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松村 正清
東京工業大学工学部電子物理科
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Yamashita Yoshiyuki
Department Of Chemical Engineering Tohoku University
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Miki K
Electrotechnical Laboratory (etl)
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Miki Kazushi
National Institute Of Materials Science (nims)
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Miki Kazushi
Aist
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Miki Kazushi
Nanoarchitecture Group Organic Nanomaterials Center National Institute For Materials Science
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Miki Kazushi
Electrotechnical Laboratory
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Sakoda T
National College Of Technology
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NAKATO Yoshihiro
Research Center for Photoenergetics of Organic Materials and Faculty if Engineering Science, Osaka U
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KOBAYASHI Hikaru
Research Center for Photoenergetics of Organic Materials, and Department of Chemistry, Faculty of En
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YAMASHITA Yoshiyuki
Research Center for Photoenergetics of Organic Materials, and Department of Chemistry, Faculty of En
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NAMBA Kenji
Research Center for Photoenergetics of Organic Materials, and Department of Chemistry, Faculty of En
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Nakato Yoshihiro
Department Of Chemistry Graduate School Of Engineering Science And Research Center For Photoenergeti
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Sakoda Tadanori
Department Of Electronics And Control Engineering Kitakyushu National College Of Technology
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Nakato Yoshihiro
Research Center For Photoenergetics Of Organic Materials And Department Of Chemistry Faculty Of Engi
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Kobayashi Hikaru
Institute Of Scientific And Industrial Research Osaka University
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Sakoda Tomoyuki
Si Technology Development Texas Instruments Inc.
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Kobayashi Hikaru
Department Of Hematology Nagano Red Cross Hospital
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Kobayashi Hikaru
Research Center For Photoenergetics Of Organic Materials And Department Of Chemistry Faculty Of Engi
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Namba Kenji
Research Center For Photoenergetics Of Organic Materials And Department Of Chemistry Faculty Of Engi
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Sakoda Tomoyuki
National College of Technology
著作論文
- Surface Preparation, Growth, and Interface Control of Ultrathin Gate Oxides
- Simultaneous Observation of SiO_2 Surface and SiO_2/Si Interface Using Self-Assembled-Monolayer Island
- Interface States at Ultrathin Chemical Oxide/Silicon Interfaces Obtained from Measurements of XPS Spectra under Biases
- Direct Spectroscopic Evidence of Bias-Induced Shifts of Semiconductor Band Edges for Metal-Insulator-Semiconductor Diodes