A Bitline Control Circuit Scheme and Redundancy Technique for High-Density Dynamic Content Addressable Memories (Special Issue on LSI Memories)
スポンサーリンク
概要
- 論文の詳細を見る
This paper describes a bitline control circuit and redundancy technique for high-density dynamic content addressable memories (CAMs). The proposed bitline control circuit can efficiently manage a dynamic CAM cell accompanied by complex operations; that is, a refresh operation, a masked search operation, and partial writing, in addition to normal read / write / search operations. By adding a small supplementary circuit to the bitline control circuit, a circuit scheme with redundancy which prevents disabled column circuits from affecting a match operation can also be obtained. These circuit technologies achieve higher-density dynamic CAMs than conventional static CAMs. These technologies have been successfully applied to a -k bit CAM with a typical cycle time of 150 ns.
- 社団法人電子情報通信学会の論文
- 1993-11-25
著者
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OZAKI Hideyuki
Renesas Technology Corp.
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Ozaki H
Renesas Technology Corp.
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MIHARA Masakatsu
Research and Development Center, Toshiba Corp.
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Hamamoto Takeshi
Ulsi Research Center Toshiba Corporation
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OZAKI Hideyuki
ULSI Development Center, Mitsubishi Electric Corp.
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Ozaki Hideyuki
Ulsi Laboratory Mitsubishi Electric Corporation
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Kobayashi Tsuguo
Semiconductor Device Engineering Laboratory Microelectronics Center Toshiba Corporation
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Kobayashi T
Strategic Planning Department National Institute Of Information And Communications Technology
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Murai Yasumitsu
the LSI Design Center, Mitsubishi Elecoric Engineering Company Limited
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Yamagata Tadato
ULSI Laboratory, Mitsubishi Electric Corporation
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Mihara Masaaki
ULSI Laboratory, Mitsubishi Electric Corporation
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Murai Yasumitsu
LSI Design Center, Mitsubishi Electric Engineering Company Limited
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Kobayashi Toshifumi
System LSI Laboratory, Mitsubishi Electric Corporation
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Yamada Michihiro
Kita-Itami Works, Mitsubishi Electric Corporation
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Mihara Masakatsu
Research And Development Center Toshiba Corp.
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Yamagata T
Mitsubishi Electric Corp. Itami‐shi Jpn
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Yamagata Tadato
Ulsi Laboratory Mitsubishi Electric Corporation
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Kobayashi T
Waseda Univ. Tokyo
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Murai Y
Mitsubishi Electric Co. Ltd. Itami‐shi Jpn
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Yamada Michihiro
Kita-itami Works Mitsubishi Electric Corporation
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HAMAMOTO Takeshi
Microelectronics Engineering Laboratory, TOSHIBA CORPORATION
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Hamamoto T
Renesas Technol. Corp. Itami‐shi Jpn
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