Impact of TDDB Distribution Function on Lifetime Estimation in Ultra-Thin Gate Oxides
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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Toriumi Akira
Advanced Lsi Technology Laboratory Research & Development Center Toshiba Co.
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Satake Hideki
Advanced Lsi Technology Laboratory Corporate R&d Center Toshiba Corporation
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Toriumi Akira
Advanced Lsi Technology Laboratory Corporate R&d Center Toshiba Corporation
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