Simultaneous-Sweep Method for Evaluation of Single-Electron Transistors with Barriers Induced by Gate Electric Field
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2004-08-15
著者
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Inokawa Hiroshi
Ntt Basic Research Laboratories Ntt Corporation
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TAKAHASHI Yasuo
NTT Basic Research Laboratories, NTT Corporation
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Takahashi Yasuo
Ntt Basic Research Laboratories Ntt Corporation
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