Foundry Metal-Oxide-Semiconductor Field-Effect-Transistor Electrometer for Single-Electron Detection

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-07-15

著者

• Inokawa Hiroshi

  Ntt Basic Research Laboratories Ntt Corporation

• CLEMENT Nicolas

  NTT Basic Research Laboratories, NTT Corporation

• Inokawa Hiroshi

  Ntt Corp. Kanagawa Jpn

• Clement Nicolas

  Ntt Basic Research Laboratories Ntt Corporation

関連論文

• A Single-Electron-Transistor Logic Gate Family for Binary, Multiple-Valued and Mixed-Mode Logic(New System Paradigms for Integrated Electronics)
• A Simulation Methodology for Single-Electron Multiple-Valued Logics and Its Application to a Latched Parallel Counter
• Single-Electron-Resolution Electrometer Based on Field-Effect Transistor(Session4B: Emerging Devices II)
• Single-Electron-Resolution Electrometer Based on Field-Effect Transistor(Session4B: Emerging Devices II)
• Charge-State Control of Phosphorus Donors in Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistor
• Multifunctional Boolean Logic Using Single-Electron Transistors(New System Paradigms for Integrated Electronics)
• Analysis of Back-Gate Voltage Dependence of Threshold Voltage of Thin Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistor and Its Application to Si Single-Electron Transistor
• A Merged Single-Electron Transistor and Metal-Oxide-Semiconductor Transistor Logic for Interface and Multiple-Valued Functions
• A Merged SET-MOSFET Logic for Interface and Multiple-Valued Functions
• Control of Electrical Properties of Single-walled Carbon Nanotubes by Low-energy Electron Irradiation
• Charge-Injection Effects in a Single 4,4''-Terphenyldithiol Molecule
• Studies on MOSFET Low-Frequency Noise for Electrometer Applications
• Simultaneous-Sweep Method for Evaluation of Single-Electron Transistors with Barriers Induced by Gate Electric Field
• Foundry Metal-Oxide-Semiconductor Field-Effect-Transistor Electrometer for Single-Electron Detection
• Molecular-Mediated Single-Electron Devices Operating at Room Temperature
• Studies on Metal–Oxide–Semiconductor Field-Effect Transistor Low-Frequency Noise for Electrometer Applications
• Back-Gate Effect on Coulomb Blockade in Silicon-on-Insulator Trench Wires
• Single-Electron-Resolution Electrometer Based on Field-Effect Transistor
• Analysis of Back-Gate Voltage Dependence of Threshold Voltage of Thin Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistor and Its Application to Si Single-Electron Transistor
• Charge-Injection Effects in a Single 4,4$''$-Terphenyldithiol Molecule

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