Evaluation of Charge Passed through Gate-Oxide Films Using a Charging Damage Measurement Electrode
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-02-15
著者
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Tamura H
R&d Center Kasado Administrative Division Power & Industrial Systems Hitachi Ltd.
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Watanabe S
Univ. Tokyo Tokyo Jpn
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YOSHIOKA Ken
Kanagawa Indnsteial Technolgy Research Institute
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MIZUTANI Tatsumi
Kasado Works, Hitachi, Ltd.
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Watanabe S
R&d Center Kasado Administrative Division Power & Industrial Systems Hitachi Ltd.
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Watanabe S
Division Of Materials Science Graduate School Of Engineering Hokkaido University
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YOSHIOKA Ken
Kasado Design Department, Semiconductor Equipment Product Division, Semiconductor Manufacturing Equi
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WATANABE Seiichi
Kasado R&D Center, Power & Industrial Systems, Hitachi Ltd.
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SUMIYA Masahiro
Kasado R&D Center, Power & Industrial Systems, Hitachi Ltd.
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TAMURA Hitoshi
Mechanical Engineering Research Laboratory, Hitachi Ltd.
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TOKUNAGA Takafumi
Device Development Center, Hitachi Ltd.
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Watanabe Seiichi
R&d Center Kasado Administrative Division Power & Industrial Systems Hitachi Ltd.
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Yoshioka K
Kasado Design Department Semiconductor Equipment Product Division Semiconductor Manufacturing Equipm
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Tamura H
Department Of Computer Science And Electronics Kyushu Institute Of Technology
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Tamura Hitomi
Network Design Research Center Kyushu Institute Of Technology
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Tamura Hitoshi
Mechanical Engineering Research Laboratory Hitachi Ltd.
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Tamura Hideki
Faculty Of Eng. Yamagata Univ.
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Tokunaga Takafumi
Device Development Center Hitachi Ltd.
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Sumiya M
R&d Center Kasado Administrative Division Power & Industrial Systems Hitachi Ltd.
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WATANABE Shigeya
Department of Engineering Physics, Faculty of Engineering, Kyoto University
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