Dependence of ECR Plasma Etching Characteristics on Sub Magnetic Field and Substrate Position
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1990-04-20
著者
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SAMUKAWA Seiji
VLSI Development Division, NEC Corporation
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Samukawa Seiji
Vlsi Development Div. Nec Corporation
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Mori S
Department Of Electric And Electrical Engineering School Of Science And Engineering Saga University
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Sasaki M
Industrial Res. Center Of Shiga Prefecture Shiga
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MORI Sumio
Dry Etching Engineering Department, ANELVA Corporation
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SASAKI Masami
Dry Etching Engineering Department, ANELVA Corporation
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Samukawa Seiji
Vlsi Development Division Nec Corporation
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