Reflectance and Wavelength-Modulated Reflectance Measurements by a Double Beam-Single Detector System
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概要
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We have reported experimental techniques to measure fundamental reflectance (FR) and wavelength-modulated reflectance (WMR) with the use of a double beam-single detector system. FR spectra of Ni and Si in the photon energy region 2.5〜5.0 eV are presented as experimental examples. In the WMR measurements, the double beam-single detector system developed by Welkowsky and Braunstein has been improved to be suitable for a small wavelength-modulation condition and for arbitrary combinations of the modulation frequency and the chopping frequency of the half-circular chopper mirror. The importance of the small modulation amplitude has been pointed out from the experimental result of WMR in Si.
- 社団法人応用物理学会の論文
- 1976-08-05
著者
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KONDO Kazuo
Department of Chemical Engineering and Materials Science, Faculty of Engineering, Doshisha Universit
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Nakai Junkichi
Department Of Electronics Faculty Of Engineering Osaka University
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Nakai Junkichi
Deparimsnt Of Elecironics Facully Of Engineering Osaka University
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Moritani Akihiro
Department Of Electronics Faculty Of Engineering Osaka University
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Moritani Akihiro
Department Of Electronic And Control System Eng. Shimane University
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Kondo Kazuo
Department Of Chemical Engineering And Materials Science Doshisha University
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Kondo Kazuo
Department Of Applied Chemistry Okayama University
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