Compton Profile of Ultra-Fine Particles of Copper
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概要
- 論文の詳細を見る
Comption profile of ultra-fine particles of Cu was measured by the use of a solid state detector and ^<241>Am isotope γ-ray source. The momentum distribution of electrons is such particles has been investigated in comparison with a polycrystallien Cu. The profile of these particles has proved to have an EWHM value narrower than that of the polycrystalline sample. The narrowing is mainly attributed to the surface state of electrons. The results were discussed in comparison with those by positron annihilation for the corresponding sample.
- 社団法人日本物理学会の論文
- 1975-12-15
著者
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Hosoya Sukeaki
Institute For Solid Physics University Of Tokyo
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Fukamachi Tomoe
Institute For Solid Physics University Of Tokyo
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Noguchi Seiichiro
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Tsuchiya Yoshimi
Deparment Of Applied Physics Tokyo Institute Of Technology
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Tsuchiya Yoshimi
Department Of Applied Physics Nagoya University:(present Address) Department Of Physics Faculty Of S
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