Influence of Line Profile on Counting Loss Correction
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概要
- 論文の詳細を見る
The recent progress in precision of X-ray diffractometry has made it necessary to take account of possible errors of various origins so far neglected. It is shown that the influence of line profile of a reflection on counting loss correction is not always negligible. Approximate estimations were made on this influence for a few typical line profiles. The results may be used for making counting loss correction more accurately or for suppressing it to a negligible extent.
- 社団法人応用物理学会の論文
- 1967-11-05
著者
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Hosoya Sukeaki
Institute For Solid Physics University Of Tokyo
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Yamagishi Tomoe
Institute For Solid State Physics University Of Tokyo
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