X-ray Measurement of Scattering Factors of Manganese and Oxygen Atoms in Manganous Oxide
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概要
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The atomic scattering factors of manganese and oxygen atoms in manganous oxide (MnO) were determined by measuring the integrated x-ray intensities of reflections from powder sample at room temperature. The intensities measured on a relative scale for five differently colored samples within an experimental error of ±0.4 to 4% were transformed to the absolute values by experimental scaling factors. The atomic scattering factors obtained were compared with those calculated by Watson and Freeman and by Suzuki and proved that the atoms were in the state of divalent ions. The tabulated anomalous dispersion terms were found to be reliable for Cu and Cr Kα radiations. The effect of non-spherical charge distributions was discussed by a comparison between the experimental and the theoretical factors.
- 社団法人日本物理学会の論文
- 1962-06-05
著者
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Hosoya Sukeaki
Institute For Solid State Physics University Of Tokyo
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Hosoya Sukeaki
Institute For Solid Physics University Of Tokyo
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Kuriyama Masao
Institute For Solid State Physics University Of Tokyo
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Kuriyama M.
Institute for Solid State Physics, University of Tokyo
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