Phase Formations and Electrical Properties of Bi_<3.15>La_<0.85>Ti_3O_<12> and Sm-Doped Bi_<3.073>La_<0.85>Sm_<0.077>Ti_3O_<12> Thin Films with Annealing Temperature
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-09-30
著者
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Lee Won-jae
Electronics And Telecommunications Research Institute
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LEE Nam-Yeal
Basic Research Laboratory, Electronics & Telecommunications Research Institute (ETRI)
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RYU Sang-OUK
Basic Research Laboratory, Electronics & Telecommunications Research Institute (ETRI)
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Yoon Sung-min
It Convergence And Component Laboratory Electronics And Telecommunications Research Institute
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Ryu S‐o
Basic Research Laboratory Electronics & Telecommunications Research Institute (etri)
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Lee Nam-yeal
It Convergence And Component Laboratory Electronics And Telecommunications Research Institute
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Lee Nam-yeal
Basic Research Laboratory Electronics And Telecommunications Research Institute (etri)
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Lee Nam-yeal
Basic Research Laboratory Electronics And Telecomunications Research Institute (etri)
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Yoon Soon-Gil
Department of Materials Engineering, Chungnam National University
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