Measurement of Refractive Index, Specific Heat Capacity, and Thermal Conductivity for Ag6.0In4.5Sb60.8Te28.7 at High Temperature

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We have measured the temperature dependence of refractive index, thermal conductivity ($K$) and specific heat capacity ($C$) for Ag6.0In4.5Sb60.8Te28.7 (AIST). For measurement of refractive index, a spectroscopic ellipsometry was employed over a wavelength range from 300 to 1700 nm whilst the temperature was increased from room temperature to 450 °C. For measurement of $K$, we used a novel instrument called “a nanosecond thermoreflectance measurement system” developed by Baba et al. Using this system, it is possible to easily obtain the $K$ of thin film samples which range in thickness from sub-micron down to 100 nm. We measured the $K$s up to 400 °C; a clear temperature dependence was observed whereby $K$s increased with increasing temperature. For measurement of $C$, we used a differential scanning calorimeter. The $C$ of AIST also increase before the melting point (530 °C); after melting the $C$ rapidly decreased with increasing temperature.
2009-05-25