Thermal Diffusivities of Tris(8-hydroxyquinoline)aluminum and N,N$'$-Di(1-naphthyl)-N,N$'$-diphenylbenzidine Thin Films with Sub-Hundred Nanometer Thicknesses

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The thermal diffusivities of tris(8-hydroxyquinoline)aluminum (Alq3) and N,N$'$-di(1-naphthyl)-N,N$'$-diphenylbenzidine ($\alpha$-NPD) films have been characterized quantitatively using a “rear heating/front detection-type” nanosecond thermoreflectance system. Alq3 or $\alpha$-NPD films sandwiched by Al films, Al/(Alq3 or $\alpha$-NPD)/Al three-layered films, were prepared by vacuum evaporation. Al acted as a reflective layer for pulse lasers in the thermoreflectance system. The nominal thicknesses of Alq3 and $\alpha$-NPD layers varied roughly from 30 to 100 nm. The thermal diffusivities of Alq3 and $\alpha$-NPD films were found to be $(1.4--1.7)\times 10^{-7}$ and $1.4\times 10^{-7}$ m2 s-1, respectively.
2010-12-25