Oka Nobuto | Graduate School Of Science And Engineering Aoyama Gakuin University
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概要
関連著者
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Oka Nobuto
Graduate School Of Science And Engineering Aoyama Gakuin University
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Shigesato Yuzo
Graduate School Of Science And Engineering Aoyama Gakuin University
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Oka Nobuto
Graduate School of Frontier Sciences, The University of Tokyo
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OKA Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University
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岡 伸人
青学大理工
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岡 伸人
東大
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岡 伸人
青山学院大学大学院理工学研究科
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Sato Yasushi
Graduate School Of Science And Engineering Aoyama Gakuin University
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SHIGESATO Yuzo
Graduate School of Science and Engineering, Aoyama Gakuin University
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Nakamura Shin-ichi
Center For Instrumental Analysis Aoyama Gakuin University
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SATO Yasushi
Graduate School of Science and Engineering, Aoyama Gakuin University
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Shigesato Yuzo
Graduate School of Science and Engineering, Aoyama Gakuin University, Sagamihara 252-5258, Japan
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馬場 哲也
産業技術研 計測標準研究部門
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BABA Tetsuya
National Research Laboratory of Metrology
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岡 伸人
東京大学大学院工学系研究科
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Taketoshi Naoyuki
National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn
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NAKAMURA Shin-ichi
Center for Instrumental Analysis, Aoyama Gakuin University
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SEINO Yutaka
National Institute of Advanced Industrial Science and Technology
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ASHIDA Toru
Graduate School of Science and Engineering, Aoyama Gakuin University
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Ashida Toru
Graduate School Of Science And Engineering Aoyama Gakuin University
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馬場 哲也
産業技術総合研究所計測標準部
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Hayashi Ryo
Canon Inc.
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AOI Takafumi
Graduate School of Science and Engineering, Aoyama Gakuin University
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KUMORI Hideya
Canon Inc.
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Aoi Takafumi
Graduate School Of Science And Engineering Aoyama Gakuin University
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Takahashi Kousuke
Graduate School of Science and Engineering, Aoyama Gakuin University, Sagamihara 252-5258, Japan
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Yamaguchi Maho
Graduate School of Science and Engineering, Aoyama Gakuin University, Sagamihara 252-5258, Japan
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Hattori Koichiro
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 3, Tsukuba, Ibaraki 305-8563, Japan
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Yagi Takashi
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Yagi Takashi
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Kato Kazuki
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo, Sagamihara 252-5258, Japan
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Ito Norihiro
Advanced Technologies Development Laboratory, Panasonic Electric Works, Ltd., 1048 Kadoma, Kadoma, Osaka 571-8686, Japan
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Baba Tetsuya
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Ito Norihiro
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo-ku, Sagamihara 229-8558, Japan
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Sato Yasusi
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo-ku, Sagamihara 229-8558, Japan
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Oka Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University, Sagamihara 252-5258, Japan
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Oka Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo-ku, Sagamihara 229-8558, Japan
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Oka Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo, Sagamihara 252-5258, Japan
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Takashima Jyunya
Graduate School of Science and Engineering, Aoyama Gakuin University, Sagamihara 252-5258, Japan
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Taketoshi Naoyuki
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Seino Yutaka
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 3, Tsukuba, Ibaraki 305-8563, Japan
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Nakamura Shin-ichi
Center for Instrumental Analysis, Aoyama Gakuin University, Sagamihara 252-5258, Japan
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Nakamura Shin-ichi
Center for Instrumental Analysis, Aoyama Gakuin University, Sagamihara 229-8558, Japan
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馬場 哲也
産業技術総合研究所
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Yagi Takashi
National Metolorogy Institute of Japan, AIST, Tsukuba, Ibaraki 305-8563, Japan
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Oka Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University, Sagamihara 229-8558, Japan
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HATTORI Koichiro
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
著作論文
- Transmission Electron Microscopy Observation on the Early Stages of Sn-Doped In_2O_3 Film Growth Deposited on Amorphous Carbon Films by DC Magnetron Sputtering
- Carrier Density Dependence of Optical Band Gap and Work Function in Sn-Doped In_2O_3 Films
- Oxidation Resistance of Ti--Si--N and Ti--Al--Si--N Films Deposited by Reactive Sputtering Using Alloy Targets
- Thermal Diffusivities of Tris(8-hydroxyquinoline)aluminum and N,N$'$-Di(1-naphthyl)-N,N$'$-diphenylbenzidine Thin Films with Sub-Hundred Nanometer Thicknesses
- Photocatalytic Activity of WO3 Films Crystallized by Postannealing in Air
- Electronic State of Amorphous Indium Gallium Zinc Oxide Films Deposited by DC Magnetron Sputtering with Water Vapor Introduction
- Effects of Energetic Ion Bombardment on Structural and Electrical Properties of Al-Doped ZnO Films Deposited by RF-Superimposed DC Magnetron Sputtering
- Early Stages of Sn-Doped In