Taketoshi Naoyuki | National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn
スポンサーリンク
概要
関連著者
-
Taketoshi Naoyuki
National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn
-
Baba Tetsuya
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
-
Yagi Takashi
National Metolorogy Institute of Japan, AIST, Tsukuba, Ibaraki 305-8563, Japan
-
馬場 哲也
産業技術総合研究所
-
Yagi Takashi
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
-
BABA Tetsuya
National Research Laboratory of Metrology
-
Kuwahara Masashi
Center For Applied Near-field Optics Research (can-for) Aist
-
Shigesato Yuzo
Graduate School Of Science And Engineering Aoyama Gakuin University
-
Suzuki Osamu
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
-
Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
-
Oka Nobuto
Graduate School of Frontier Sciences, The University of Tokyo
-
Baba Tetsuya
Department Of Pure And Applid Sciences University Of Tokyo:national Research Laboratory Of Metrology
-
Fons Paul
Center For Applied Near-field Optics Research (can-for) Aist
-
Tominaga Junji
Center For Applied Near-field Optics Research (can-for) Aist
-
馬場 哲也
産業技術研 計測標準研究部門
-
Fukaya Toshio
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
-
Yamakawa Yuzo
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
-
SUZUKI Michio
J. A. Woollam Japan Corporation
-
馬場 哲也
産業技術総合研究所計測標準部
-
Yagi Takashi
National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
-
Tsutsumi Kouichi
J. A. Woollam Japan Co., Fuji Building 2F, 5-22-9 Ogikubo, Suginami-ku, Tokyo 167-0051, Japan
-
Kato Kazuki
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo, Sagamihara 252-5258, Japan
-
Tominaga Junji
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
-
Suzuki Michio
J. A. Woollam Japan Co., Fuji Building 2F, 5-22-9 Ogikubo, Suginami-ku, Tokyo 167-0051, Japan
-
岡 伸人
青学大理工
-
TAKETOSHI Naoyuki
National Research Laboratory of Metrology
-
ONO Akira
National Research Laboratory of Metrology
-
小野 晃
独立行政法人産業技術総合研究所 計量標準総合センター
-
岡 伸人
東大
-
Ono Akira
National Institute For Researches In Inorganic Materials
-
Ono Akira
National Institute For Research In Inorganic Materials
-
Ono A
National Inst. Res. In Inorganic Materials Ibaraki Jpn
-
OKA Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University
-
SEINO Yutaka
National Institute of Advanced Industrial Science and Technology
-
Oka Nobuto
Graduate School Of Science And Engineering Aoyama Gakuin University
-
岡 伸人
青山学院大学大学院理工学研究科
-
Kato Hideyuki
National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
-
Hattori Koichiro
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 3, Tsukuba, Ibaraki 305-8563, Japan
-
Yagi Takashi
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
-
Ito Norihiro
Advanced Technologies Development Laboratory, Panasonic Electric Works, Ltd., 1048 Kadoma, Kadoma, Osaka 571-8686, Japan
-
Simpson Robert
Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
-
Fons Paul
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
-
Yamakawa Yuzo
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
-
Kuwahara Masashi
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
-
Fukaya Toshio
Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
-
Oka Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo, Sagamihara 252-5258, Japan
-
Taketoshi Naoyuki
National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
-
Taketoshi Naoyuki
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
-
Taketoshi Naoyuki
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
-
Kuwahara Masashi
Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8562, Japan
-
Taketoshi Naoyuki
National Metolorogy Institute of Japan, AIST, Tsukuba, Ibaraki 305-8563, Japan
-
Suzuki Osamu
Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8565, Japan
-
Kuwahara Masashi
Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8565, Japan
-
Yamashita Yuichiro
National Institute of Advanced Industrial Science and Technology in Japan, Tsukuba, Japan
-
Okabe Takashi
Graduate School of Science and Engineering, Aoyama Gakuin University, Sagamihara 252-5258, Japan
-
BABA Tetsuya
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
-
YOSHIKAWA Toru
Graduate School of Science and Engineering, Aoyama Gakuin University
-
JIA Junjun
Graduate School of Science and Engineering, Aoyama Gakuin University
-
HATTORI Koichiro
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
-
SEINO Yutaka
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
著作論文
- Observation of Heat Diffusion across Submicrometer Metal Thin Films Using a Picosecond Thermoreflectance Technique
- Measurement of Refractive Index, Specific Heat Capacity, and Thermal Conductivity for Ag6.0In4.5Sb60.8Te28.7 at High Temperature
- Thermal Diffusivities of Tris(8-hydroxyquinoline)aluminum and N,N$'$-Di(1-naphthyl)-N,N$'$-diphenylbenzidine Thin Films with Sub-Hundred Nanometer Thicknesses
- Thermal Boundary Resistance between N,N'-Bis(1-naphthyl)-N,N'-diphenylbenzidine and Aluminum Films
- Effect of Oxygen Impurities on Thermal Diffusivity of AlN Thin Films Deposited by Reactive RF Magnetron Sputtering
- Temperature Dependence of the Thermal Properties of Optical Memory Materials
- Measurements of Temperature Dependence of Optical and Thermal Properties of Optical Disk Materials
- Complex Refractive Index, Specific Heat Capacity, and Thermal Conductivity for Crystalline Sb--Te Alloys and ZnS--SiO
- Effect of Synthesis Condition on Thermal Diffusivity of Molybdenum Thin Films Observed by a Picosecond Light Pulse Thermoreflectance Method
- Thermal Conductivity Measurements of Sb–Te Alloy Thin Films Using a Nanosecond Thermoreflectance Measurement System
- Thermal Conductivity of Amorphous Indium-Gallium-Zinc Oxide Thin Films