Thermal Conductivity Measurements of Sb–Te Alloy Thin Films Using a Nanosecond Thermoreflectance Measurement System
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概要
- 論文の詳細を見る
Using a nanosecond thermoreflectance measurement system, which enables the measurement of the thermal conductivity of nanometer-scale thin films, we have measured the thermal conductivities of Sb2Te, Sb2Te3, SbTe9, Sb, and Te thin films at room temperature. We clarified that the thermal conductivities of Sb–Te alloys depend on the Sb and Te atomic ratios. A large change in thermal conductivity was observed in the vicinity of the composition ratio of Sb2Te3. We proposed that this large change may be attributable to the formation of an Sb atomic network in the crystalline structure of the Sb–Te alloy.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2007-10-15
著者
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Taketoshi Naoyuki
National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn
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Fons Paul
Center For Applied Near-field Optics Research (can-for) Aist
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Kuwahara Masashi
Center For Applied Near-field Optics Research (can-for) Aist
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Suzuki Osamu
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Baba Tetsuya
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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馬場 哲也
産業技術総合研究所
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Yagi Takashi
National Metolorogy Institute of Japan, AIST, Tsukuba, Ibaraki 305-8563, Japan
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