Readout Durability Improvement of Super-Resolution Near-Field Structure Discs with PtOx–SiO2 Recording and GeNy Interfacial Layers
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概要
- 論文の詳細を見る
Two dielectric materials were added to a super-resolution near-field optical disc structure (super-RENS) to improve the readout durability. PtOx–SiO2 (Pt8.4Si21.1O70.5) layers showed O2 desorption for temperatures above 200 °C and were usable as write-once recording layers. The GeNy interfacial layers located between the Sb75Te25 and (ZnS)85(SiO2)15 layers suppressed degradation in the reflected light intensity from the disc, i.e., maintained the recorded structure as is, to at least $5\times 10^{4}$ readout cycles using a recorded pattern designed to accelerate disc deterioration. The carrier-to-noise ratio (CNR) obtained for 100-nm marks (laser wavelength: 405 nm, numerical aperture: 0.65) was about 43 dB. It was possible to readout $2.6\times 10^{5}$ cycles before the CNR decreased by 3 dB. This represents an improvement of a factor of 70 over the readout durability of a conventional super-RENS structure.
- 2007-02-25
著者
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Yamakawa Yuzo
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
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Shima Takayuki
Center For Applied Near-field Optics Research (can-for) Aist
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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Yamakawa Yuzo
Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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