Bit Error Rate Characteristics of Write Once Read Many Super-Resolution Near Field Structure Disk
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概要
- 論文の詳細を見る
We firstly report the bit error rate (bER) characteristics of a super-resolution near-field structure (super-RENS) write-once read-many (WORM) disk in a blue laser optical system, (laser wavelength 405 nm, numerical aperture 0.85) with a carrier-to-noise ratio (CNR) at the 75 nm mark (50 GB Capacity) of 47 dB and a low frequency noise of approximately 20 dB. The recording state should be precisely controlled by an adequate writing strategy for bER measurement. Together with the above conditions, using the frequency-dependent gain controlled equalization (EQ) and advanced partial-response maximum likelihood (PRML) technique, bER of $10^{-3}$ order at 50 GB was obtained.
- 2006-02-15
著者
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Tominaga Junji
Center For Applied Near-field Optics Research (can-for) Aist
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Kim Jooho
Digital Media R&d Center Samsung Electronics Co. Ltd.
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BAE Jaecheol
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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Lee Jinkyung
Digital Media R&d Center Samsung Electronics Co. Ltd
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Park Insik
Digital Media R&d Center Samsung Electronics Co. Ltd
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Hwang Inoh
Digital Media R&d Center Samsung Electronics Co. Ltd.
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Park Hyunsoo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Tominaga Junji
Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Kikukawa Takashi
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Fukuzawa Narutoshi
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Kobayashi Tatsuhiro
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Lee Jinkyung
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Bae Jaecheol
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Bae Jaecheol
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Kim Jooho
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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