Park Insik | Digital Media R&d Center Samsung Electronics Co. Ltd
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概要
関連著者
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Park Insik
Digital Media R&d Center Samsung Electronics Co. Ltd
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Hwang Inoh
Digital Media R&d Center Samsung Electronics Co. Ltd.
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Kim Jooho
Digital Media R&d Center Samsung Electronics Co. Ltd.
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Kim Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
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KIM Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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Tominaga Junji
Center For Applied Near-field Optics Research (can-for) Aist
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Shin Dongho
Digital Media R&d Center Samsung Electronics Co. Ltd
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Yoon Duseop
Digital Media R&d Center Samsung Electronics Co. Ltd
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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Park Hyunsoo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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BAE Jaecheol
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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Lee Jinkyung
Digital Media R&d Center Samsung Electronics Co. Ltd
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Bae Jaecheol
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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PARK Yunchang
Analytical Engineering Center, Samsung Advanced Institute of Technology
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Tominaga Junji
Laboratory For Advanced Optical Technology (laotech) National Institute Of Advanced Industrial Science And Technology (aist)
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Zhao Hui
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Lee Kyunggeun
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 443-742, Korea
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Zhao Hui
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 443-742, Korea
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Ro Myongdo
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Park Changmin
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Jung Moonil
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Lee Kyunggeun
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 443-742, Korea
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TOMINAGA Junji
Laboratory for Advanced Optical Technology (LAOTECH), National Institute of Advanced Industrial Scie
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Tominaga Junji
Laboratory For Advanced Optical Technology National Institute Of Advanced Industrial Science And Tec
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KUWAHARA Masashi
Laboratory for Advanced Optical Technology, National Institute of Advanced Industrial Science and Te
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YOON Duseop
Digital Media R&D Center, Samsung Electronics Co., Ltd.
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HWANG Inoh
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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PARK Insik
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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PARK Changmin
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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JUNG Moonil
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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KUWAHARA Masasi
Laboratory for Advanced Optical Technology, National Institute of Advanced Industrial Science and Te
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Yoon Duseop
Digital Media R&d Center Samsung Electronics Co. Ltd.
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Shin Dongho
Digital Media R&d Center Samsung Electronics Co. Ltd.
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Kuwahara Masasi
Laboratory For Advanced Optical Technology National Institute Of Advanced Industrial Science And Tec
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Chung Chongsam
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Park Hyunsoo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Park Hyunsoo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 443-742, Korea
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Shin Dongho
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Ro Myongdo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Yoon Duseop
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Yoon Duseop
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 443-742, Korea
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Tominaga Junji
Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8563, Japan
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Tominaga Junji
Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Tominaga Junji
Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology (AIST), 305-8563, Japan
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Kikukawa Takashi
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Fukuzawa Narutoshi
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Kobayashi Tatsuhiro
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Park Insik
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 443-742, Korea
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Park Insik
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
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Park Changmin
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Lee Jinkyung
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Lee Jinkyung
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Park Yunchang
Analytical Engineering Center, Samsung Advanced Institute of Technology, Kihung, Yongin, 449-712, Korea
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Park Yunchang
Analytical Engineering Center, Samsung Advanced Institute of Technology, Kihung, Yongin 449-712, Korea
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Kim Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Kim Hyunki
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Jung Moonil
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Bae Jaecheol
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Bae Jaecheol
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
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Kim Jooho
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Kim Jooho
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Kim Jooho
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Kim Jooho
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
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Kim Jooho
Digital Media R&D Center, Samsung Electronics Co., Ltd, 416, Maetan-3, Paldal-Gu, Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, Samsung Electronics Co., Ltd, 416, Maetan-3, Paldal-Gu, Suwon 442-742, Korea
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Yoon Duseop
Digital Media R&D Center, Samsung Electronics Co., Ltd, 416, Maetan-3, Paldal-Gu, Suwon 442-742, Korea
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Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd, 416, Maetan-3, Paldal-Gu, Suwon 442-742, Korea
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Kuwahara Masashi
Laboratory for Advanced Optical Technology, National Institute of Advanced Industrial Science and Technology (AIST), C4, 1-1-1 Higashi, Tsukuba 305-8562, Japan
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Tominaga Junji
Laboratory for Advanced Optical Technology, National Institute of Advanced Industrial Science and Technology (AIST), C4, 1-1-1 Higashi, Tsukuba 305-8562, Japan
著作論文
- Super-Resolution Near-Field Structure with Alternative Recording and Mask Materials
- Signal Characteristics of Super-Resolution Near-Field Structure Disks with 100 GB Capacity
- Signal Characteristics of Super-Resolution Near-Field Structure Disk in Blue Laser System
- Error Rate Reduction of Super-Resolution Near-Field Structure Disc
- Random Signal Characteristics of Super Resolution Near Field Structure Read-Only Memory Disc
- Bit Error Rate Characteristics of Write Once Read Many Super-Resolution Near Field Structure Disk
- Reduced-State Sequence Estimation with Level Adaptation for High-Density Disc
- Adaptive Writing Strategy Based on Bit-Indexed Writing Parameters
- Super Resolution Read Only Memory Disc Using Super-Resolution Near-Field Structure Technology
- Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc
- Phase Change Super Resolution near Field Structure ROM
- Super-Resolution Near-Field Structure with Alternative Recording and Mask Materials