Ro Myongdo | Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea

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概要

• Ro Myongdoの詳細を見る
• 同名の論文著者
• Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Koreaの論文著者

関連著者

• Kim Jooho

  Digital Media R&d Center Samsung Electronics Co. Ltd.

• Park Insik

  Digital Media R&d Center Samsung Electronics Co. Ltd

• Ro Myongdo

  Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea

• Park Changmin

  Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea

• Kim Hyunki

  Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea

• Jung Moonil

  Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea

• KIM Hyunki

  Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD

• PARK Changmin

  Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD

• JUNG Moonil

  Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD

• Lee Jinkyung

  Digital Media R&d Center Samsung Electronics Co. Ltd

• Hwang Inoh

  Digital Media R&d Center Samsung Electronics Co. Ltd.

• Ro Myongdo

  Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea

• Park Insik

  Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea

• Park Changmin

  Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea

• Lee Jinkyung

  Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea

• Kim Hyunki

  Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea

• Jung Moonil

  Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea

• Kim Jooho

  Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea

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著作論文

• Random Signal Characteristics of Super Resolution Near Field Structure Read-Only Memory Disc
• Phase Change Super Resolution near Field Structure ROM

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