PARK Changmin | Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
スポンサーリンク
概要
関連著者
-
Kim Jooho
Digital Media R&d Center Samsung Electronics Co. Ltd.
-
KIM Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
-
PARK Changmin
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
-
JUNG Moonil
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
-
Kim H
Department Of Electrical Engineering And Institute For Nano Science Korea University
-
HWANG Inoh
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
-
PARK Insik
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
-
RO Myongdo
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
-
LEE Jinkyung
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
-
Park Insik
Digital Media R&d Center Samsung Electronics Co. Ltd
-
Ro Myongdo
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
-
Ro Myongdo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Park Changmin
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
-
Park Changmin
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Kim Hyunki
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Kim Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
-
Jung Moonil
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
-
Jung Moonil
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Kim Jooho
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
著作論文
- Phase Change Super Resolution near Field Structure ROM
- Random Signal Characteristics of Super Resolution Near Field Structure Read-Only Memory Disc