Park Changmin | Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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概要
- Park Changminの詳細を見る
- 同名の論文著者
- Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Koreaの論文著者
関連著者
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Kim Jooho
Digital Media R&d Center Samsung Electronics Co. Ltd.
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Park Insik
Digital Media R&d Center Samsung Electronics Co. Ltd
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Ro Myongdo
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Park Changmin
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Kim Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
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Jung Moonil
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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KIM Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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PARK Changmin
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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JUNG Moonil
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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Lee Jinkyung
Digital Media R&d Center Samsung Electronics Co. Ltd
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Hwang Inoh
Digital Media R&d Center Samsung Electronics Co. Ltd.
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Ro Myongdo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Park Changmin
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Lee Jinkyung
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
-
Kim Hyunki
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Jung Moonil
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
-
Kim Jooho
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
著作論文
- Random Signal Characteristics of Super Resolution Near Field Structure Read-Only Memory Disc
- Phase Change Super Resolution near Field Structure ROM