Random Signal Characteristics of Super Resolution Near Field Structure Read-Only Memory Disc
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概要
- 論文の詳細を見る
We report the random pattern signal characteristics of the super resolution near field structure (Super-RENS) disk in a red laser optical system. (Laser wavelength 659 nm, numerical aperture 0.6) We improved the carrier to noise ratio (CNR) characteristics and the low frequency noise by optimizing the layer design and the pit structure, which results in 53 dB CNR at 173 nm pit length. It is equivalent to 50 GB capacity if it is converted by Blu-ray Disc (BD) specification according to the ratio of beam size. We also improved the readout power margin and the stability greatly by introducing the thermal control layer. The eye pattern under phase locked loop (PLL) state could be obtained through equalization adjustment (EQ). Through above improvements, we obtain the bER of $4.6\times 10^{-4}$ at 50 GB level by using partial response maximum likelihood (PRML) method.
- 2006-02-15
著者
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Kim Jooho
Digital Media R&d Center Samsung Electronics Co. Ltd.
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KIM Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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PARK Changmin
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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JUNG Moonil
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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Park Insik
Digital Media R&d Center Samsung Electronics Co. Ltd
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Ro Myongdo
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Ro Myongdo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Park Changmin
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Park Changmin
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Kim Hyunki
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Kim Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
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Jung Moonil
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Jung Moonil
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Kim Jooho
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
関連論文
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- Metal-Free Phthalocyanine Layer Prepared on Read-Only-Memory Disc for Super-Resolution Readout
- Super-RENS Disk for Blue Laser System Retrieving Signals from Polycarbonate Substrate Side
- Nanoscale Dots Fabrication by Volume Change Thermal Lithography
- Signal Characteristics of Super-Resolution Near-Field Structure Disks with 100GB Capacity
- Super Resolution Read Only Memory Disc Using Super-Resolution Near-Field Structure Technology
- Signal Characteristics of Super-Resolution Near-Field Structure Disk in Blue Laser System
- Phase Change Super Resolution near Field Structure ROM
- Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc
- Signal Characteristics of Super-Resolution Near-Field Structure Disks with 100 GB Capacity
- Nanoscale Dots Fabrication by Volume Change Thermal Lithography
- Signal Characteristics of Super-Resolution Near-Field Structure Disk in Blue Laser System
- Error Rate Reduction of Super-Resolution Near-Field Structure Disc
- Random Signal Characteristics of Super Resolution Near Field Structure Read-Only Memory Disc
- Bit Error Rate Characteristics of Write Once Read Many Super-Resolution Near Field Structure Disk
- Reduced-State Sequence Estimation with Level Adaptation for High-Density Disc
- Adaptive Writing Strategy Based on Bit-Indexed Writing Parameters
- Super-Resolution Readout of 50 nm Read-Only-Memory Pits Using Optics Based on High-Definition Digital Versatile Disc
- Super Resolution Read Only Memory Disc Using Super-Resolution Near-Field Structure Technology
- Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc
- Phase Change Super Resolution near Field Structure ROM
- Super-Resolution Near-Field Structure with Alternative Recording and Mask Materials