Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-05-15
著者
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Kim H
Department Of Electrical Engineering And Institute For Nano Science Korea University
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Shin Dongho
Digital Media R&d Center Samsung Electronics Co. Ltd
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Kim Jooho
Digital Media R&d Center Samsung Electronics Co. Ltd.
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YOON Duseop
Digital Media R&D Center, Samsung Electronics Co., Ltd.
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HWANG Inoh
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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KIM Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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PARK Insik
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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BAE Jaecheol
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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- Nanoscale Dots Fabrication by Volume Change Thermal Lithography
- Signal Characteristics of Super-Resolution Near-Field Structure Disk in Blue Laser System
- Error Rate Reduction of Super-Resolution Near-Field Structure Disc
- Random Signal Characteristics of Super Resolution Near Field Structure Read-Only Memory Disc
- Bit Error Rate Characteristics of Write Once Read Many Super-Resolution Near Field Structure Disk
- Super-Resolution Readout of 50 nm Read-Only-Memory Pits Using Optics Based on High-Definition Digital Versatile Disc
- Super Resolution Read Only Memory Disc Using Super-Resolution Near-Field Structure Technology
- Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc
- Phase Change Super Resolution near Field Structure ROM
- Super-Resolution Near-Field Structure with Alternative Recording and Mask Materials