Bae Jaecheol | Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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概要
- Bae Jaecheolの詳細を見る
- 同名の論文著者
- Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Koreaの論文著者
関連著者
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Kim Jooho
Digital Media R&d Center Samsung Electronics Co. Ltd.
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BAE Jaecheol
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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Park Insik
Digital Media R&d Center Samsung Electronics Co. Ltd
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Hwang Inoh
Digital Media R&d Center Samsung Electronics Co. Ltd.
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Bae Jaecheol
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Tominaga Junji
Center For Applied Near-field Optics Research (can-for) Aist
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KIM Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD
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Lee Jinkyung
Digital Media R&d Center Samsung Electronics Co. Ltd
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Park Hyunsoo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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Kim Hyunki
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Paldal-Gu, Suwon, 442-742, Korea
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Shin Dongho
Digital Media R&d Center Samsung Electronics Co. Ltd
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Yoon Duseop
Digital Media R&d Center Samsung Electronics Co. Ltd
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Chung Chongsam
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Park Hyunsoo
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD, Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Hwang Inoh
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Tominaga Junji
Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Kikukawa Takashi
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Fukuzawa Narutoshi
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Kobayashi Tatsuhiro
Advanced Storage Technology Group, Devices Development Center, TDK Corporation, 462-1 Otai, Saku, Nagano 385-0009, Japan
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Park Insik
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Lee Jinkyung
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Bae Jaecheol
Digital Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Bae Jaecheol
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
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Kim Jooho
Digital Media R&D Center, Samsung Electronics Co., Ltd., Yeongtong-Gu, Suwon 442-742, Korea
著作論文
- Error Rate Reduction of Super-Resolution Near-Field Structure Disc
- Bit Error Rate Characteristics of Write Once Read Many Super-Resolution Near Field Structure Disk
- Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc