First Playback of High-Definition Video Contents from Super-Resolution Near-Field Structure Optical Disc
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概要
- 論文の詳細を見る
A super-resolution near-field structure (super-RENS) read-only-memory disc with an In–Sb thin film as a super-resolution active layer corresponding to a 50 Gbyte capacity per layer was fabricated. The carrier-to-noise ratio at a pit length of 75 nm exceeded 40 dB and a bit error rate (bER) of the order of $10^{-5}$ satisfying the $3.0\times 10^{-4}$ criterion was obtained. To the best of our knowledge, this is the first report on the successful and seamless playback performance of a high-definition video content from the super-RENS disc at a data transfer rate of either 36 or 72 Mbps. The bER results of fixed and adaptive partial response maximum likelihood detections are described.
- 2010-08-25
著者
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NAKANO Takashi
Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial S
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Takeshita Nobuo
Advanced Technology R&d Center Mitsubishi Electric Corp.
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Shima Takayuki
Center For Applied Near-field Optics Research (can-for) Aist
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Nakai Kenya
Advanced Technology R & D Center Mitsubishi Electric Corp
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Shinoda Masahisa
Advanced Technology R & D Center Mitsubishi Electric Corp
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Hyot Bérangère
CEA, LETI, MINATEC, 17 rue des Martyrs, 38054 Grenoble Codex 9, France
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André Bernard
CEA, LETI, MINATEC, 17 rue des Martyrs, 38054 Grenoble Codex 9, France
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Poupinet Ludovic
CEA, LETI, MINATEC, 17 rue des Martyrs, 38054 Grenoble Codex 9, France
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Shinoda Masahisa
Advanced Technology R&D Center, Mitsubishi Electric Corporation, Nagaokakyo, Kyoto 617-8550, Japan
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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Takeshita Nobuo
Advanced Technology R&D Center, Mitsubishi Electric Corporation, Nagaokakyo, Kyoto 617-8550, Japan
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Ohmaki Masayuki
Advanced Technology R&D Center, Mitsubishi Electric Corporation, Nagaokakyo, Kyoto 617-8550, Japan
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André Bernard
CEA, LETI, MINATEC, 17 rue des Martyrs, 38054 Grenoble Codex 9, France
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Shima Takayuki
Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8562, Japan
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Hwang Inoh
Digtal Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Lee Yongwoon
Digtal Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Zhao Hui
Digtal Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Kim Jooho
Digtal Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Kim Jooho
Digtal Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Hwang Inoh
Digtal Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Lee Yongwoon
Digtal Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Tominaga Junji
Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8562, Japan
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Zhao Hui
Digtal Media R&D Center, Samsung Electronics Co., Ltd., Suwon 442-742, Korea
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Nakano Takashi
Center for Applied Near-Field Optics Research, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8562, Japan
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