Effect of SiO2 Addition to PtOx Recording Layer of Super-Resolution Near-Field Structure Disc
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概要
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A dielectric material (SiO2) was added to the PtOx recording layer of a recently developed super-resolution near-field structure (super-RENS) disc to enhance the readout durability. The PtOx–SiO2 (Pt8.4Si21.1O70.5) composite layer was prepared by a chip-on-target sputtering method. The recorded mark became significantly solid-filled when the prepared layer was used to replace the PtOx layer of the original disc. The carrier-to-noise ratio obtained for the 100 nm marks (laser wavelength: 405 nm, numerical aperture: 0.65) was 44 dB. It was possible to readout $7.5\times 10^{4}$ times until the initial carrier-to-noise ratio (CNR) decreases by 3 dB; this is a more than one-order-of-magnitude enhancement compared with at in the simple PtOx case. Readout laser power was not reduced. This enhancement is achieved as a result of improving the recording layer of the super-RENS disc.
- 2007-06-30
著者
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NAKANO Takashi
Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial S
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Tominaga Junji
Center For Applied Near-field Optics Research (can-for) Aist
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Shima Takayuki
Center For Applied Near-field Optics Research (can-for) Aist
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Shima Takayuki
Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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