Suzuki Osamu | Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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概要
- Suzuki Osamuの詳細を見る
- 同名の論文著者
- Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japanの論文著者
関連著者
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Kuwahara Masashi
Center For Applied Near-field Optics Research (can-for) Aist
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Suzuki Osamu
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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Taketoshi Naoyuki
National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn
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Tominaga Junji
Center For Applied Near-field Optics Research (can-for) Aist
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Baba Tetsuya
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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馬場 哲也
産業技術総合研究所
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Yagi Takashi
National Metolorogy Institute of Japan, AIST, Tsukuba, Ibaraki 305-8563, Japan
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Fukaya Toshio
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
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Yamakawa Yuzo
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
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Fons Paul
Center For Applied Near-field Optics Research (can-for) Aist
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SUZUKI Michio
J. A. Woollam Japan Corporation
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Yagi Takashi
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Tsutsumi Kouichi
J. A. Woollam Japan Co., Fuji Building 2F, 5-22-9 Ogikubo, Suginami-ku, Tokyo 167-0051, Japan
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Suzuki Michio
J. A. Woollam Japan Co., Fuji Building 2F, 5-22-9 Ogikubo, Suginami-ku, Tokyo 167-0051, Japan
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BABA Tetsuya
National Research Laboratory of Metrology
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Yagi Takashi
National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Tominaga Junji
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Kato Hideyuki
National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Simpson Robert
Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Tsutsumi Kouichi
J. A. Woollam Japan Co., Inc., Fuji Building 2F, 5-22-9 Ogikubo, Suginami, Tokyo 167-0051, Japan
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Fons Paul
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Tominaga Junji
Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Suzuki Michio
J. A. Woollam Japan Co., Inc., Fuji Building 2F, 5-22-9 Ogikubo, Suginami, Tokyo 167-0051, Japan
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Yamakawa Yuzo
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Kuwahara Masashi
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Kuwahara Masashi
Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Fukaya Toshio
Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Fukaya Toshio
Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Taketoshi Naoyuki
National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
著作論文
- Measurement of Refractive Index, Specific Heat Capacity, and Thermal Conductivity for Ag6.0In4.5Sb60.8Te28.7 at High Temperature
- Temperature Dependence of Complex Refractive Index of Sputtered Sb–Te Alloy Thin Films
- Temperature Dependence of the Thermal Properties of Optical Memory Materials
- Measurements of Temperature Dependence of Optical and Thermal Properties of Optical Disk Materials
- Thermal Conductivity Measurements of Sb–Te Alloy Thin Films Using a Nanosecond Thermoreflectance Measurement System