BABA Tetsuya | National Research Laboratory of Metrology
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概要
関連著者
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BABA Tetsuya
National Research Laboratory of Metrology
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Baba Tetsuya
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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馬場 哲也
産業技術研 計測標準研究部門
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馬場 哲也
産業技術総合研究所
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Taketoshi Naoyuki
National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn
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馬場 哲也
産業技術総合研究所計測標準部
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Yagi Takashi
National Metrology Institute of Japan (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Yagi Takashi
National Metolorogy Institute of Japan, AIST, Tsukuba, Ibaraki 305-8563, Japan
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ONO Akira
National Research Laboratory of Metrology
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Ono Akira
National Institute For Researches In Inorganic Materials
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Ono Akira
National Institute For Research In Inorganic Materials
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Ono A
National Inst. Res. In Inorganic Materials Ibaraki Jpn
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Fukaya Toshio
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
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Yamakawa Yuzo
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
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Fons Paul
Center For Applied Near-field Optics Research (can-for) Aist
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Tominaga Junji
Center For Applied Near-field Optics Research (can-for) Aist
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Kuwahara Masashi
Center For Applied Near-field Optics Research (can-for) Aist
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Yagi Takashi
National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Suzuki Osamu
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Tominaga Junji
Center for Applied Near Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
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岡 伸人
青学大理工
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EMMANUEL Schaub
National Research Laboratory of Metrology
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TAKETOSHI Naoyuki
National Research Laboratory of Metrology
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FUNAMOTO Hiroyuki
Seiko Instruments & Electronics Ltd.
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NISHIKAWA Akira
Seiko Instruments & Electronics Ltd.
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小野 晃
独立行政法人産業技術総合研究所 計量標準総合センター
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Funamoto Hiroyuki
Seiko Instruments Inc.
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岡 伸人
東大
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Ishii Juntaro
National Inst. Of Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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Baba Tetsuya
Department Of Pure And Applid Sciences University Of Tokyo:national Research Laboratory Of Metrology
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Nishikawa A
Seiko Instrument & Electronics
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OKA Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University
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SUZUKI Michio
J. A. Woollam Japan Corporation
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Oka Nobuto
Graduate School Of Science And Engineering Aoyama Gakuin University
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岡 伸人
青山学院大学大学院理工学研究科
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Shigesato Yuzo
Graduate School Of Science And Engineering Aoyama Gakuin University
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Ishii Juntaro
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Shimizu Yukiko
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Yagi Takashi
Thermophysical Properties Section, Material Properties Division, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8563, Japan
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Yamashita Yuichiro
Thermophysical Properties Section, Material Properties Division, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8563, Japan
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Yagi Takashi
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Tsutsumi Kouichi
J. A. Woollam Japan Co., Fuji Building 2F, 5-22-9 Ogikubo, Suginami-ku, Tokyo 167-0051, Japan
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Kato Kazuki
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo, Sagamihara 252-5258, Japan
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Ito Norihiro
Advanced Technologies Development Laboratory, Panasonic Electric Works, Ltd., 1048 Kadoma, Kadoma, Osaka 571-8686, Japan
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Fons Paul
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Tominaga Junji
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Suzuki Michio
J. A. Woollam Japan Co., Fuji Building 2F, 5-22-9 Ogikubo, Suginami-ku, Tokyo 167-0051, Japan
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Yamakawa Yuzo
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Kuwahara Masashi
Center for Applied Near-Field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Fukaya Toshio
Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Oka Nobuto
Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo, Sagamihara 252-5258, Japan
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Taketoshi Naoyuki
National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Taketoshi Naoyuki
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Oka Nobuto
Graduate School of Frontier Sciences, The University of Tokyo
著作論文
- Front Mirror Absorption Characterization on High-Power GaAs Laser Diodes by Means of Thermoreflectance Technique
- Observation of Heat Diffusion across Submicrometer Metal Thin Films Using a Picosecond Thermoreflectance Technique
- Thermal Conductivity of Diamond Films Synthesized by Microwave Plasma CVD
- Thermal Diffusivities of Tris(8-hydroxyquinoline)aluminum and N,N$'$-Di(1-naphthyl)-N,N$'$-diphenylbenzidine Thin Films with Sub-Hundred Nanometer Thicknesses
- Development of Network Database System for Thermophysical Property Data of Thin Films
- Temperature Dependence of the Thermal Properties of Optical Memory Materials
- Reflectance Thermometry for Microscale Metal Thin Films
- Measurements of Temperature Dependence of Optical and Thermal Properties of Optical Disk Materials