Publisher's Note: "Optical Characterization and X-ray Photoelectron Spectroscopy of Erbium-Doped Silicon Suboxide Infrared Emitting at 1.5 μm"

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概要

• 論文の詳細を見る
• INSTITUTE OF PURE AND APPLIED PHYSICSの論文
• 2009-01-25

著者

• Yoshida Takeshi

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Kishi Masato

  Department Of Applied Physics University Of Tokyo

• Tsuchiya Masahiro

  National Defense Academy

• Yamamoto Naokatsu

  National Inst. Information And Communications Technol. (nict) Tokyo Jpn

• Naka Yoshihiro

  Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan

• Miyawaki Daisuke

  Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan

• Minami Takashi

  Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan

• Ito Kosaburo

  Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan

• Nakamura Yusui

  Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan

• Nakamura Yusui

  Graduate School of Science and Technology, Kumamoto University, 2-39-1 Kurokami, Kumamoto 860-8555, Japan

• Tsuchiya Masahiro

  National Institute of Information and Communications Technology, Koganei, Tokyo 184-8794, Japan

• Yoshida Takeshi

  Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan

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