Determination of Atomic Displacement Modulation in Multi-Layer Structure by X-Ray Diffraction
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概要
- 論文の詳細を見る
A new method of Fourier analysis is shown by which both concentration and atomic displacement modulations existing in multilayer structures can be reproduced from the measurement of the integrated intensities of satellite reflections. By applying the present method to a molecular beam epitaxy grown (GaAs)_8(AlAs)_8 superlattice, the atomic displacement modulation in interface region is given as well as concentration modulation.
- 社団法人応用物理学会の論文
- 1985-01-20
著者
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SAKATA Makoto
Department of Applied Physics, Nagoya University
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HARADA Jimpei
Department of Applied Physics, Nagoya University
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Sakata Makoto
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Sakata M
Omron Corp. Ibaraki Jpn
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Mashita Masao
Toshiba R & D Center
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Harada Jimpei
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Harada J
School Of Natural Science The University Of Electro-communications
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Ashizawa Yasuo
Toshiba Research And Development Center
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Ashizawa Yasuo
Toshiba R & D Center
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KASHIHARA Yasuharu
Department of Applied Physics, Nagoya University
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Kashihara Y
Department Of Applied Physics Nagoya University
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Kashihara Yasuharu
Department Of Applied Physics Nagoya University
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