Measurement of Elastic Constants of MBE Grown (Ga_<0.5>Al_<0.5>)As Mixed Thin Film Crystal by Diffuse X-Ray Scattering
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概要
- 論文の詳細を見る
By a measurement of X-ray thermal diffuse scattering and an analysis based on a least squares fitting procedure, it was demonstrated that a set of elastic constants could be determined for an MBE grown (Ga_<0.5>Al_<0.5>)As mixed crystal of 4 μm thickness. The absolute value of C.. and the ratios of the elastic constants, C_<12>/C_<11> and C_<44>/C_<11>, were determined to be 13.32±0.35 [×10^<11>dyn/cm^2], 0.418±10.021 and 0.473±10.013, respectively, for the sample. It turned out that the elastic constants of the mixed thin film crystal was slightly higher than that expected from the linear interpolation between GaAs and AlAs.
- 社団法人応用物理学会の論文
- 1986-09-20
著者
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Harada Jimpei
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Harada J
School Of Natural Science The University Of Electro-communications
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KASHIWAGURA Nobuo
Faculty of Engineering, Gifu University
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Kashiwagura N
Gifu Univ. Gifu Jpn
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KASHIHARA Yasuharu
Department of Applied Physics, Nagoya University
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Kashihara Y
Department Of Applied Physics Nagoya University
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Kashihara Yasuharu
Department Of Applied Physics Nagoya University
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KASHIWAGURA Nobuo
Department of Basic Sciences, Faculty of Engineering, Gifu University
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