X-Ray Diffraction from GaAs/AlAs/GaAs Grown on GaAs(001) by MBE
スポンサーリンク
概要
- 論文の詳細を見る
The structure of a GaAs/AlAs/GaAs multilayer grown on a GaAs(001) substrate by MBE was investigated by X-ray diffraction. The lattice spacing in such a single bunch of AlAs layers was found to expand along the epitaxial-growth direction due to a Poisson expansion. The lattice mismatch between GaAs and AlAs perpendicular to the growth direction is compensated.
- 1989-10-20
著者
-
Harada Jimpei
Department Of Applied Physics Faculty Of Engineering Nagoya University
-
Kashihara Yasuharu
Department Of Applied Physics Nagoya University
-
Harada Jimpei
Department of Applied Physics, Nagoya University, Chikusa-ku, Nagoya 464
-
Ikeda Kenjirou
Department of Applied Physics, Nagoya University, Chikusa-ku, Nagoya 464
関連論文
- Sm^ Photoluminescence and X-Ray Scattering Studies of A- and B-Type Epitaxial CaF_2 Layers on Si(111)
- Neutron Scattering Study of Lattice Dynamics in CuBr. : II. Anharmonic Effect on Debye-Waller Factor
- Origins of Spurious Peaks of Total Reflection X-Ray Fluorescence Analysis of Si Wafers Excited by Monochromatic X-Ray Beam W-Lβ
- Influence of Standing Waves on Impurity Analysis of Si(001) Wafer Using Commercially Available Total-Reflection X-Ray Fluorescence Analyzer
- Main Peak Profiles of Total Reflection X-Ray Fluorescence Analysis of Si(001) Wafers Excited by Monochromatic X-Ray Beam W-Lβ(II)
- Main Peak Profiles of Total Reflection X-Ray Fluorescence Analysis of Si(001) Wafers Excited by Monochromatic X-Ray Beam W-Lβ (I)
- Neutron Scattering Study of Lattice Dynamics in CuBr : Part I. Phonon Dispersion Relations
- Determination of Elastic Constants of K_2[PtCl_4] by Ultrasonic Measurements and Confirmation of Angular Dependence of Their Component by X-Ray Diffuse Scattering
- Neutron Diffraction Study of the Structure of Cubic CsPbBr_3
- Anharmonic Debye-Waller Factor for the Atom of 4/mmm Site Symmetry
- X-Ray Diffraction Study of Fine Gold Particles Prepared by Gas Evaporation Technique. : I. General Feature
- Short-Range Order Parameter of Disordered Cu-29.8 at.% Pd Alloy and the Correlative Microdomain Model
- Determination of Atomic Displacement Modulation in Multi-Layer Structure by X-Ray Diffraction
- Determination of Lattice Distortion in (GaAs)_(AlAs)_ Superlattice Layers by X-Ray Diffraction
- High Resolution Investigation of the Rod-Shaped Scattering from a (111) Si Surface by a Synchrotron Radiation Source
- Atomic Displacements at Surface of Si-Wafer(111)
- Measurement of Elastic Constants of MBE Grown (Ga_Al_)As Mixed Thin Film Crystal by Diffuse X-Ray Scattering
- Random Distribution of Ga and Al Atoms in MBE Grown (Al_Ga_)As
- X-Ray Diffraction Study of Fine Gold Particles Prepared by Gas Evaporation Technique. : II. Characteristic Temperature
- Electron Scattering from Si Surface and Interface by Cross-Sectional Transmission Electron Microscopy
- Study of Local Atomic Order in a Ternary Cu_Ni_Zn_ Alloy Using Anomalous Scattering of Synchrotron Radiation
- Cation and Anion Displacements at Hetero-Interfaces of (GaAs)_(AlAs)_ Superlattice Layers : Surfaces, Interfaces and Films
- Orientation of Pyridine in TaS_2(Py)_
- Neutron Diffraction Study of the Structure in Cubic CsPbCl_3
- Electron Diffraction Study of TaS_2 Intercalated with Pyridine
- Upper and Lower Critical Fields of TaS_2(Pyridine)_
- Structural Phase Transitions in CsPbBr_3
- Determination of Dynamical Matrix by Means of X-Ray Thermal Diffuse Scattering
- Characterization of Ultra Fine Palladium Particles with the Mean Size of 20 A by X-Ray Diffraction
- X-Ray Diffraction from GaAs/AlAs/GaAs Grown on GaAs(001) by MBE