Characterization of Ultra Fine Palladium Particles with the Mean Size of 20 A by X-Ray Diffraction
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概要
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Ultra fine palladium particles with the mean size of 20 A, prepared by VEROS(Vacuum Evaporation and Running Oil Substrate) method, were identified to bethe same f.c.c. structure as the bulk specimen by X-ray diffraction method. Thelattice parameter was found to be larger than the bulk value by an amount of1.3 %. From the profile analysis of the 220 Debye-Scherrer line the size distribu-tion of the specimen was obtained, which is a very sharp distribution with a peakat 21 :1.3 A. This result was confirmed by a direct measurement of electron ml-crograph.
- 社団法人日本物理学会の論文
- 1981-09-15
著者
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Ohshima Ken-ichi
Department Of Applied Physics Nagoya University
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Harada Jimpei
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Yatsuya Shigeki
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Yatsuya Shigeki
Department Of Applied Physics Nagoya University
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