Contactless Measurement of Short Carrier Lifetime in Heat-Treated N-Types Silicon

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1984-03-20

著者

• SAKATA Makoto

  Department of Applied Physics, Nagoya University

• Sakata Makoto

  Department Of Applied Physics Faculty Of Engineering Nagoya University

• OHTA Eiji

  Department of Material Science, Faculty of Science and Technology, Keio University

• Ohta Eiji

  Department Of Instrumentation Engineering Faculty Of Science And Technology Keio University

• Ohta Eiji

  Department Of Agricultural Chemistry Faculty Of Agriculture Kyoto University

• Yamazaki Tatsuya

  Department of Instrumentation Engineering, Faculty of Science and Technology, Keio University

• Ogita Yoh-ichiro

  Department of Electrical Engineering, Ikutoku Technical University

• Ikegami Yoshikazu

  Department of Instrumentation Engineering, Faculty of Science and Technology, Keio University

• Onaka Hiroshi

  Department of Electrical Engineering, Ikutoku Technical University

• Onaka Hiroshi

  Department Of Electrical Engineering Ikutoku Technical University

• Yamazaki Tatsuya

  Department Of Instrumentation Engineering Faculty Of Science And Technology Keio University:(present

• Yamazaki Tatsuya

  Department Of Applied Chemistry Graduate School Of Engineering Tohoku University

• Ikegami Y

  Furukawa Electric Co. Ltd. Yokohama Jpn

• Ogita Y

  Department Of Electrical Engineering Ikutoku Technical University

• Ogita Yoh-ichiro

  Department Of Electrical Engineering Ikutoku Technical University

• Ikegami Yoshikazu

  Department Of Instrumentation Engineering Faculty Of Science And Technology Keio University

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